Residual Stress Evolution during Decomposition of Ti(1-x)Al(x)N Coatings Using High-Energy X-Rays

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Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.

Info:

Periodical:

Materials Science Forum (Volumes 524-525)

Edited by:

W. Reimers and S. Quander

Pages:

619-624

DOI:

10.4028/www.scientific.net/MSF.524-525.619

Citation:

M. R. Terner et al., "Residual Stress Evolution during Decomposition of Ti(1-x)Al(x)N Coatings Using High-Energy X-Rays", Materials Science Forum, Vols. 524-525, pp. 619-624, 2006

Online since:

September 2006

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$35.00

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