Grinding-Induced Residual Shear Stresses

Abstract:

Article Preview

Pearlitic steel and pure tungsten specimens were ground using a table-type grinding machine. The thin surface layers affected by the grinding process were characterized using focussed ion beam milling and microscopy. The strongly graded zone altered due to severe plastic deformation and recrystallisation was found to be less than 3m thick. The microstructure in that zone depends on the grinding parameters. Using synchrotron X-ray diffraction, the residual stresses were measured for penetration depths ranging from 0.25 m to 9 m. Based on the approach by Dölle and Hauk, the residual shear stresses were separated from the residual normal stresses. In pearlitic steel, residual shear stresses of opposite sign were observed in the two phases (ferrite and cementite) and found to be compensating each other, while shear stresses were proved to be absent in single-phase tungsten. These results underline that residual shear stresses caused by severe plastic shear deformation exist only as micro-stresses.

Info:

Periodical:

Materials Science Forum (Volumes 524-525)

Edited by:

W. Reimers and S. Quander

Pages:

685-690

DOI:

10.4028/www.scientific.net/MSF.524-525.685

Citation:

B. Okolo and A. Wanner, "Grinding-Induced Residual Shear Stresses", Materials Science Forum, Vols. 524-525, pp. 685-690, 2006

Online since:

September 2006

Export:

Price:

$35.00

[1] H. Behnken, V. Hauk and B. Krüger: Z. Metallkd, Vol. 92 (2001) 3, p.212.

[2] H. Dölle and J. B. Cohen: Metall. Trans. A, Vol. 11A, (1980), p.159.

[3] V. Hauk (Ed. ): Structural and Residual Stress Analysis by Nondestructive Methods, (Elsevier Science BV, Amsterdam, The Netherland 1997).

[4] B. Okolo, F. Perez-Willard, J. Hawecker, D. Gerthsen and A. Wanner: J. Materials Processing Technology (submitted).

[5] H. Dölle and V. Hauk: Härterei. Tech. Mitt., 31 (1976), p.165.

[6] R. A. Winholtz and J. B. Cohen: Metall. Trans. A, Vol. 23A, (1992), p.341.

[7] B.L. Henke, E. M. Gullikson and J. C. Davis, X-ray Interactions: Photoabsorption, Scattering, Transmission and Reflection at E=50 - 30000 eV, Z=1 - 92: Atomic Data and Nuclear Data Tables, Vol. 54 (1993) 2, p.181.

DOI: 10.1006/adnd.1993.1013

[8] V. Hauk (Ed. ): Structural and Residual Stress Analysis by Nondestructive Methods, (Elsevier Science BV, Amsterdam, The Netherland 1997), p.231.

[9] H. Behnken and V. Hauk: Mat. Sci. Forum, ECRS6, Coimbra, Portugal, (2002), p.269.

In order to see related information, you need to Login.