High Temperature Annealing Study of Al2O3 Deposited by ALCVD on n-Type 4H-SiC

Abstract:

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Al2O3 has been grown by Atomic Layer Chemical Vapour Deposition (ALCVD) on ntype 4H-SiC using O3 as an oxidant. After post-deposition, annealing at high temperature (1000°C) in Argon atmosphere for different time periods (1h, 2h, 3h) was performed. Bulk and interface properties of the as-grown as well as the annealed films were studied by electrical measurements (CV, IV, DLTS) and Secondary Ion Mass Spectrometry (SIMS) measurements. The electrical measurements show a decreasing shift of the flatband voltage indicating a diminution of the negative oxide charges with increasing annealing time. After annealing at 1000°C for 3h, the flatband voltage shift has decreased to 6V. The SIMS measurements indicate a double interface with a SiOx (x ≤ 2) interlayer in the as-grown samples while only one interface is observed after annealing, leading to improved electrical behavior of the Metal-Oxide-Semiconductor devices.

Info:

Periodical:

Materials Science Forum (Volumes 527-529)

Edited by:

Robert P. Devaty, David J. Larkin and Stephen E. Saddow

Pages:

1067-1070

DOI:

10.4028/www.scientific.net/MSF.527-529.1067

Citation:

M. Avice et al., "High Temperature Annealing Study of Al2O3 Deposited by ALCVD on n-Type 4H-SiC", Materials Science Forum, Vols. 527-529, pp. 1067-1070, 2006

Online since:

October 2006

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$35.00

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