High Temperature Characterization of 4H-SiC Bipolar Junction Transistors

Abstract:

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This paper summarizes the recent demonstration of 3200 V, 10 A BJT devices with a high common emitter current gain of 44 in the linear region, and a specific on-resistance of 8.1 mΩ- cm2 (10 A at 0.90 V with a base current of 350 mA and an active area of 0.09 cm2). The onresistance increases to 40 mΩ-cm2 at 350°C, while the DC current gain decreases to 30. A sharp avalanche behavior was observed with a leakage current of 10 μA at a collector voltage of 3.2 kV.

Info:

Periodical:

Materials Science Forum (Volumes 527-529)

Edited by:

Robert P. Devaty, David J. Larkin and Stephen E. Saddow

Pages:

1437-1440

DOI:

10.4028/www.scientific.net/MSF.527-529.1437

Citation:

S. Krishnaswami et al., "High Temperature Characterization of 4H-SiC Bipolar Junction Transistors", Materials Science Forum, Vols. 527-529, pp. 1437-1440, 2006

Online since:

October 2006

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Price:

$35.00

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