Optical Characterization of ZnO Materials Grown by Modified Melt Growth Technique

Abstract:

Article Preview

ZnO bulk crystal wafers, undoped and doped with various impurities of Ga, Er, Co, Ho, Fe, Mn, and co-doped Mg-Li, have been prepared by a modified melt growth method, and characterized by optical techniques of Raman scattering, photoluminescence and UV-visible transmission. Their wurtzite structures were confirmed, with a small degree of crystalline imperfection. It is shown that with some dopants, such as, Co and Fe, the electronic energy gap is affected much less than the optical absorption gap. Computer analysis has helped greatly in obtaining useful information of the optical properties of the ZnO bulk materials.

Info:

Periodical:

Materials Science Forum (Volumes 527-529)

Edited by:

Robert P. Devaty, David J. Larkin and Stephen E. Saddow

Pages:

1567-1570

DOI:

10.4028/www.scientific.net/MSF.527-529.1567

Citation:

Z. C. Feng et al., "Optical Characterization of ZnO Materials Grown by Modified Melt Growth Technique", Materials Science Forum, Vols. 527-529, pp. 1567-1570, 2006

Online since:

October 2006

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.