Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry

Abstract:

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Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.

Info:

Periodical:

Materials Science Forum (Volumes 537-538)

Edited by:

J. Gyulai and P.J. Szabó

Pages:

329-336

DOI:

10.4028/www.scientific.net/MSF.537-538.329

Citation:

A. Deák et al., "Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry ", Materials Science Forum, Vols. 537-538, pp. 329-336, 2007

Online since:

February 2007

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Price:

$35.00

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