Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry


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Nanostructured Langmuir-Blodgett (LB) films of Stöber-silica nanoparticles have been prepared on silicon and quartz glass substrates. The deposited layers were investigated using scanning angle reflectometry and UV-Vis spectroscopy. The reflectivity and the transmittance spectra of the LB films were evaluated using a model based on thin layer optics. Film thickness and effective refractive index of the films were determined. From the refractive index values the volume fraction of the particles in the film was estimated by effective medium approach.



Materials Science Forum (Volumes 537-538)

Edited by:

J. Gyulai and P.J. Szabó




A. Deák et al., "Characterisation of Solid Supported Nanostructured Thin Films by Scanning Angle Reflectometry and UV-Vis Spectrometry ", Materials Science Forum, Vols. 537-538, pp. 329-336, 2007

Online since:

February 2007




[1] E. Hild, Z. D. Hórvölgyi, In the Book of Techniques innovantes de caractérisation optique microstructurale des couches minces, IEM, Montpellier, France, 2005, pp.121-140.

[2] L. Heinrich, E. K. Mann, J. C. Voegel, G. J. M. Koper, P. Schaaf, Langmuir Vol. 12 (1996), p.4857.

[3] A. Ulman, Ultrathin organic films from LB to self assembly, Academic Press, New York (1991), p.116.

[4] M. Mohai, É. Kiss, A. Tóth, J. Szalma, I. Bertóti, Surf. Interface Anal. Vol. 32 (2002), p.772.

[5] T. Marek, Cs. Szeles, K. Süvegh, É. Kiss, A. Vértes, K.G. Lynn, Langmuir Vol. 15 (1999), p.8189.

DOI: 10.1021/la990109o

[6] N. A. Kotov, F. C. Meldrum, C. Wu, J. H. Fendler, J. Phys. Chem. 98 (1994) 2735.

[7] J. H. Fendler, F. C. Meldrum, Adv. Mater. 7 (1995) 607.

[8] M. Szekeres, O. Kamalin, R.A. Schoonheydt, K. Wostyn, K. Clays, A. Persoons, I. Dékány, J. Mater. Chem. Vol. 12 (11) (2002), p.3268.

DOI: 10.1039/b204687c

[9] W. Stöber, A. Fink, E. Bohn, J. Colloid Interface Sci. Vol. 26 (1968), p.62.

[10] J.K. Bailey, M.L. Mecartney, Colloids Surf. Vol. 63 (1992), p.131.

[11] Gy. Tolnai, F. Csempesz, M. Kabai-Faix, E. Kálmán, Zs. Keresztes, A. L. Kovács, J. J. Ramsden, Z. Hórvölgyi, Langmuir Vol. 17(19) (2001), p.2683.

DOI: 10.1021/la0007372

[12] Gy. Tolnai, A. Agod, M. Kabai-Faix, A. L. Kovács, J. J. Ramsden, Z. Hórvölgyi, J. Phys. Chem. B Vol. 107 (2003), p.11109.

DOI: 10.1021/jp0344949

[13] T. Lohner, M. Fried, P. Petrik, O. Polgar, J. Gyulai, W. Lehnert, Mat. Sci. Eng. B-Solid State Mat. Adv. Techn. 69 (Sp. Iss. ) (2000), p.182.

[14] T. Lohner, N.Q. Khanh, Z. Zolnai, Acta Physica Slovaca 48 (4) (1998), p.441.

[15] A. Deák, I. Székely, E. Kálmán, Zs. Keresztes, A.L. Kovács, Z. Hórvölgyi, Thin Solid Films Vol. 484 (2005), p.310.

DOI: 10.1016/j.tsf.2005.01.096

[16] E. Hild, T. Seszták, D. Völgyes, Z. Hórvölgyi, Progr. Colloid Polym. Sci., Vol. 125 (2004), p.61.

[17] E.K. Mann, L. Heinrich, P. Schaaf, Langmuir Vol. 13 (1997), p.4906.

[18] E.K. Mann, L. Heinrich, J.C. Heinrich, P. Schaaf, Progr. Colloid Polym. Sci. Vol. 110 (1998), p.296.

[19] F. Abelès, Ann. Phys. 5 (1950) 596.

[20] H. Wolter, Handbuch der Physik, vol. 24, Springer Verlag, Berlin (1956), p.461.

[21] E. Hild, Periodica Polytechnica - Chem. Eng. Vol. 19(4) (1975), p.291.

[22] Software Spectra, Inc., http: /www. sspectra. com.

[23] A. Vasicek, Optics of Thin Films, North Holland Publishing Company, Amsterdam (1960), p.124.

[24] F. Garcia-Santamaria, E. Palacios, H. Migues, M. Ibisate, F. Meseguer, C. López, Langmuir Vol. 18 (2002), p. (1942).

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