3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

Abstract:

Article Preview

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

Info:

Periodical:

Materials Science Forum (Volumes 539-543)

Main Theme:

Edited by:

T. Chandra, K. Tsuzaki, M. Militzer , C. Ravindran

Pages:

2353-2358

Citation:

U. Lienert et al., "3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation", Materials Science Forum, Vols. 539-543, pp. 2353-2358, 2007

Online since:

March 2007

Export:

Price:

$38.00

[1] H.F. Poulsen: Three-dimensional X-ray Diffraction Microscopy (Springer, Berlin, 2004).

[2] H.F. Poulsen, D. Juul Jensen and G.B.M. Vaughan: MRS Bull. Vol. 29 (2004), p.166.

[3] D.R. Haeffner, J.D. Almer and U. Lienert: Mater. Sci. Eng. A Vol. 399 (2005), p.120.

[4] P. Lin, G. Palumbo, U. Erb and K.T. Aust: Scripta Metall. Vol. 33 (1995), p.1387.

[5] G.S. Rohrer: Ann. Rev. of Mat. Res. Vol. 35 (2005), p.99.

[6] See http: /mimp. materials. cmu. edu/publications/index. html.

[7] J. Gruber, D.C. George, A.P. Kuprat, G.S. Rohrer, A.D. Rollett: Scripta Materialia Vol. 53 (2005), p.351.

[8] D. Kinderlehrer, J. Lee, I. Livshits, and S. Taasan: Mesoscale Simulation of Grain Growth, in Continuum Scale Simulation of Engineering Materials: Fundamentals - Microstructures - Process Applications (Wiley-VCH Verlag, Weinheim, Germany, 2004), pp.356-367.

DOI: https://doi.org/10.1002/3527603786.ch16

[9] E.M. Lauridsen, S. Schmidt, R.M. Suter, H.F. Poulsen: J. Appl. Cryst. Vol. 34 (2001), p.744.

[10] R.M. Suter, D. Hennessy, C. Xiao, and U. Lienert, submitted to Reviews of Scientific Instruments; see also http: /x2d. phys. cmu. edu/3dxdm.

[11] R.I. Barabash and P. Klimanek: J. Appl. Cryst. Vol. 32 (1999), p.1050.

[12] B. Jakobsen, H.F. Poulsen, U. Lienert, J. Almer, S.D. Shastri, H.O. Sørensen, C. Gundlach,W. Pantleon: in preparation.

[13] H. Mughrabi, T. Ungár, W. Kienle, M. Wilkens: Philos. Mag. A Vol. 53 (1986), p.793.

[14] W. Pantleon, H.F. Poulsen, J. Almer and U. Lienert: Mater. Sci. Eng. A Vol. 387-389 (2004), p.339.

[15] X. Huang and N. Hansen: Scripta Mater. Vol. 37 (1997), p.1.

[16] H.F. Poulsen, U. Lienert and W. Pantleon: Mater. Sci. Tech. Vol. 21 (2005), p.1397.