Measuremet of Mechanical Properties of Thin Films and Nanostructured Materials at High Spatial Resolution

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The development of nanostructured materials and coatings has driven the development of indentation-based assessment techniques which aim to generate useful mechanical property information. This paper introduces an approach to determine the limits for which direct measurement of these properties are possible and highlights the importance of modelling if reliable data is to be obtained from very thin coatings (<200nm) and fine grained materials.

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Periodical:

Materials Science Forum (Volumes 539-543)

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Edited by:

T. Chandra, K. Tsuzaki, M. Militzer , C. Ravindran

Pages:

3534-3539

Citation:

S.J. Bull, "Measuremet of Mechanical Properties of Thin Films and Nanostructured Materials at High Spatial Resolution", Materials Science Forum, Vols. 539-543, pp. 3534-3539, 2007

Online since:

March 2007

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