In-Situ SEM/EBSP Analysis during Annealing in a Pure Aluminum Foil for Capacitor

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In-situ SEM/EBSP analysis has been performed during the evolution of the cube texture in a pure aluminum foil. In general, foils for capacitor are manufactured in an industrial process of casting, homogenizing, hot rolling, cold rolling (CR), partial annealing (PA), additional rolling (AR) and final annealing (FA). The foil samples after CR or AR in the process were analyzed by the SEM/EBSP technique at a constant temperature which was step-heated repeatedly by 10-20K from a room temperature to 623K or 598K. In a CRed sample, cube ({001}<100>) grains begin to grow preferentially at 503K to cover the sample. On the other hand, in a sample subjected to PA at 503K and AR, cube grains coarsened rapidly and preferentially at more than 533K in contrast to other oriented small grains remaining their sizes. Further, intragranular misorientation analysis revealed that the misorientation, which corresponds to dislocation density or strain, was much smaller in cube grains than in S ({123}<634>) and Cu ({112}<111>) ones.

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Periodical:

Materials Science Forum (Volumes 539-543)

Main Theme:

Edited by:

T. Chandra, K. Tsuzaki, M. Militzer , C. Ravindran

Pages:

362-367

Citation:

M. Kobayashi et al., "In-Situ SEM/EBSP Analysis during Annealing in a Pure Aluminum Foil for Capacitor", Materials Science Forum, Vols. 539-543, pp. 362-367, 2007

Online since:

March 2007

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$38.00

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DOI: https://doi.org/10.1016/1359-6454(96)00078-x

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