On Strain-Induced Grain Growth Using Modified Monte Carlo Method and Digital Image Correlation Technique


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In this study the strain-induced grain growth was simulated on an aluminum bicrystal by using channel-die compression. After compression of the bicrystal up to 5% deformation the strain mapping were characterized by using digital image correlation (DIC) technique and the 2D strain filed provided data to simulate grain growth using a modified Monte Carlo method. The strain-induced grain growth on grain boundary was simulated and compared with experiment after annealing at 450°C for 4 hours. The relation between the deformation heterogeneity and the grain growth was discussed in this work.



Materials Science Forum (Volumes 558-559)

Edited by:

S.-J.L. Kang, M.Y. Huh, N.M. Hwang, H. Homma, K. Ushioda and Y. Ikuhara




W. L. Lin and J. C. Kuo, "On Strain-Induced Grain Growth Using Modified Monte Carlo Method and Digital Image Correlation Technique", Materials Science Forum, Vols. 558-559, pp. 1121-1126, 2007

Online since:

October 2007




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DOI: https://doi.org/10.1016/0001-6160(84)90151-2

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