Mapping Partially Recrystallised Structures by 3DXRD


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A partially recrystallised sample has been characterised by 3DXRD. A gauge volume of 200μm × 700μm × 300μm has been fully mapped. Deformed and recrystallised regions within the selected gauge volume are distinguished based on the sharpness of the diffraction spots. Information corresponding to a 5D (Φ1, Φ, Φ2, z, x · y) map is deducted from the 3DXRD data.



Materials Science Forum (Volumes 558-559)

Edited by:

S.-J.L. Kang, M.Y. Huh, N.M. Hwang, H. Homma, K. Ushioda and Y. Ikuhara




S.S. West et al., "Mapping Partially Recrystallised Structures by 3DXRD", Materials Science Forum, Vols. 558-559, pp. 389-394, 2007

Online since:

October 2007




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