Three-Dimensional Microstructure Reconstruction Using FIB-OIM

Abstract:

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A new method for reconstructing a three-dimensional microstructure using the focused ion beam-orientation imaging microscopy (FIB-OIM) is introduced. The technique is important for the study of three-dimensional microstructures of materials because it can automatically align (register) a series of parallel sections with both topological information and orientation information at the sub-micrometer scale. Using voxel-based tessellation, a three-dimensional microstructure is reconstructed by registering each section. The application of the method to a cubic material is described and, based on the reconstruction, the grain shape and grain size distribution are characterized.

Info:

Periodical:

Materials Science Forum (Volumes 558-559)

Edited by:

S.-J.L. Kang, M.Y. Huh, N.M. Hwang, H. Homma, K. Ushioda and Y. Ikuhara

Pages:

915-920

DOI:

10.4028/www.scientific.net/MSF.558-559.915

Citation:

S. B. Lee et al., "Three-Dimensional Microstructure Reconstruction Using FIB-OIM", Materials Science Forum, Vols. 558-559, pp. 915-920, 2007

Online since:

October 2007

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Price:

$35.00

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