TEM Characterization of 2º Tilt Grain Boundary in Alumina


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Dislocation structure of {1120}/<1100> 2º tilt grain boundary in alumina was observed by transmission electron microscopy (TEM). The grain boundary consisted of periodical array of basal dislocations, which were dissociated into pairs of 1/3<1010> and 1/3<0110> partials with {1120} stacking-fault in between. The relationship between the separation distance of partials and the stacking-fault was modeled by considering the force balances of periodical dislocations. The estimated stacking-fault energy for 2o tilt grain boundary was consistent with the previous reports.



Materials Science Forum (Volumes 561-565)

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Edited by:

Young Won Chang, Nack J. Kim and Chong Soo Lee




E. Tochigi et al., "TEM Characterization of 2º Tilt Grain Boundary in Alumina", Materials Science Forum, Vols. 561-565, pp. 2427-2430, 2007

Online since:

October 2007




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