TEM Characterization of 2º Tilt Grain Boundary in Alumina

Abstract:

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Dislocation structure of {1120}/<1100> 2º tilt grain boundary in alumina was observed by transmission electron microscopy (TEM). The grain boundary consisted of periodical array of basal dislocations, which were dissociated into pairs of 1/3<1010> and 1/3<0110> partials with {1120} stacking-fault in between. The relationship between the separation distance of partials and the stacking-fault was modeled by considering the force balances of periodical dislocations. The estimated stacking-fault energy for 2o tilt grain boundary was consistent with the previous reports.

Info:

Periodical:

Materials Science Forum (Volumes 561-565)

Main Theme:

Edited by:

Young Won Chang, Nack J. Kim and Chong Soo Lee

Pages:

2427-2430

DOI:

10.4028/www.scientific.net/MSF.561-565.2427

Citation:

E. Tochigi et al., "TEM Characterization of 2º Tilt Grain Boundary in Alumina", Materials Science Forum, Vols. 561-565, pp. 2427-2430, 2007

Online since:

October 2007

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$35.00

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