γ-TiAl has a tetragonal structure that is almost cubic (c/a ≈ 1.02). As a result of this, the electron backscatter diffraction patterns (EBSPs) of orientations related by 90°<100] rotations are almost identical. Reliable orientation measurement during automated EBSD mapping requires distinguishing very small differences in the positions of certain bands within the EBSPs. EBSD was used to measure the micro-texture and bulk texture of γ-TiAl hot-deformed under conditions approximating plane-strain compression. The reliability and accuracy of the indexing was assessed by inspecting the orientation maps for misindexing and by comparing the texture measured using EBSD with that measured using X-ray diffraction (XRD). Using Advanced Fit refinement and high-resolution EBSPs produced reliable and accurate results. Substantial misindexing was present when the EBSPs were indexed using the Hough transform method alone.