Classification and Computer Simulation of 2D Tessellations

Abstract:

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In an analogy to the 3D tool of tessellation classification – w−s diagram, a similar graphical device is proposed for 2D tessellations. Any tessellation is represented by a point in the Cartesian coordinate system with the axes Ep (the mean cell perimeter) and CV a (the coefficient of cell area variation). Images of tessellations and p−CV a diagrams for selected tessellations with low and high values of CV a are shown as examples.

Info:

Periodical:

Materials Science Forum (Volumes 567-568)

Edited by:

Pavel Šandera

Pages:

281-284

DOI:

10.4028/www.scientific.net/MSF.567-568.281

Citation:

P. Ponížil et al., "Classification and Computer Simulation of 2D Tessellations", Materials Science Forum, Vols. 567-568, pp. 281-284, 2008

Online since:

December 2007

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Price:

$35.00

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