Residual Stress in α-Brass during Annealing


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The evolution of residual stress and crystallographic texture during thermal treatment was studied using X-ray diffraction. Polycrystalline α-brass samples were examined after cold rolling and afterwards after annealing at different temperatures in the range of 50 0C - 450 0C. Additionally, the width of the diffraction peak was measured in order to estimate the variation of the dislocation density. The interpretation of experimental data was based on a fitting procedure for which the anisotropic diffraction elastic constants calculated by a self-consistent approach were used. As the result of analysis, the values of the first order and second order stresses were determined in each sample.



Materials Science Forum (Volumes 571-572)

Edited by:

A. R. Pyzalla, A. Borbély and H.-P. Degischer




R. Wawszczak et al., "Residual Stress in α-Brass during Annealing", Materials Science Forum, Vols. 571-572, pp. 69-73, 2008

Online since:

March 2008




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