Characterization of Thin Layer SnO2/Glass by Neutrons Reflectometry

Abstract:

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The thermal annealing behavior of the SnO2 thin films elaborated by sol-gel method has been studied by the neutrons reflectivity technique. From the fit of the experimental data using Parratt32 software program developed at HMI, Berlin, scattering length density, thickness and roughness are extracted. The obtained results show that the film thickness increases with the increasing annealing temperature, and the roughness is higher at 500 °C. Whereas, approximately, the same scattering length density is obtained after each annealing temperature.

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Periodical:

Edited by:

N.Gabouze

Pages:

155-160

DOI:

10.4028/www.scientific.net/MSF.609.155

Citation:

M. F. Khelladi et al., "Characterization of Thin Layer SnO2/Glass by Neutrons Reflectometry", Materials Science Forum, Vol. 609, pp. 155-160, 2009

Online since:

January 2009

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Price:

$35.00

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