X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase

Abstract:

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The 10M modulated crystal structure in Ni-Mn-Ga martensitic phase with about 0.5 MPa twinning stress, was studied by X-ray diffraction reciprocal space mapping (RSM). The experimental procedure is established for collecting large range of RSM with scattering planes inclined to the surface of specimen. The investigation focused on the superlattice reflections caused by the modulation, which always appeared in two <110> directions in bulk material. The distribution of two modulation domains varies with scattering locations.

Info:

Periodical:

Edited by:

V. A. Chernenko and J. M. Barandiaran

Pages:

63-68

DOI:

10.4028/www.scientific.net/MSF.635.63

Citation:

Y. L. Ge et al., "X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase", Materials Science Forum, Vol. 635, pp. 63-68, 2010

Online since:

December 2009

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