Charge Collection Efficiency of 6H-SiC P+N Diodes Degraded by Low-Energy Electron Irradiation

Abstract:

Article Preview

The effect of electron irradiation on the charge collection efficiency of a 6H-SiC p+n diode has been studied. The diodes were irradiated with electrons of energies from 100 keV to 1 MeV. The charge collection efficiencies of the samples were measured for alpha particles before and after the electron irradiation. The electron irradiation at 100 keV does not affect the charge collection efficiency, while the electron irradiation at 200 keV or higher decreases the charge collection efficiency. The degree of the degradation of the diodes correlates with the energy of the electron irradiation.

Info:

Periodical:

Materials Science Forum (Volumes 645-648)

Edited by:

Anton J. Bauer, Peter Friedrichs, Michael Krieger, Gerhard Pensl, Roland Rupp and Thomas Seyller

Pages:

921-924

DOI:

10.4028/www.scientific.net/MSF.645-648.921

Citation:

N. Iwamoto et al., "Charge Collection Efficiency of 6H-SiC P+N Diodes Degraded by Low-Energy Electron Irradiation ", Materials Science Forum, Vols. 645-648, pp. 921-924, 2010

Online since:

April 2010

Export:

Price:

$38.00

[1] P.J. Sellin and J. Vaitkus, Nucl. Instr. and Meth. A, Vol. 557 (2006), p.479.

[2] S. Onoda, N. Iwamoto, M. Murakami, T. Ohshima, T. Hirao, K. Kojima, K. Kawano, and I. Nakano, Mater. Sci. Forum, Vol. 615-617 (2009), p.861.

[3] F. Nava, P. Vanni, M. Bruzzi, S. Lagomarsino, S. Sciortino, G. Wagner, and C. Lanzieri, IEEE Trans. Nucl. Sci. Vol. 51 (2004), p.238.

DOI: 10.1109/tns.2004.825095

[4] N. Iwamoto, S. Onoda, S. Hishiki, T. Ohshima, M. Murakami, I. Nakano, K. Kawano, Mater. Sci. Forum, Vol. 600-603 (2009) p.1043.

DOI: 10.4028/www.scientific.net/msf.600-603.1043

[5] F. Moscatelli, A. Scorzoni, A. Poggi, M. Bruzzi, S. Sciortino, S. Lagomarisino, G. Wagner, I. Mandic, R. Nipoti, IEEE Trans. Nucl. Sci., Vol. 53 (2006), p.1557.

DOI: 10.1109/tns.2006.872202

[6] S. Onoda, T. Ohshima, T. Hirao, K. Mishima, S. Hishiki, N. Iwamoto, K. Kojima, and K. Kawano, IEEE Trans. Nucl. Sci. Vol. 54 (2007), p. (1953).

DOI: 10.1109/tns.2007.910203

[7] L. Strasta, J.P. Bergman, E. Janzén, A. Henry, J. Lu, J. Appl. Phys., Vol. 96 (2004), p.4909.

[8] K. Danno and T. Kimoto, J. Appl. Phys., Vol. 101 (2007), p.103704.

[9] J.F. Seely, B. Kjornrattanawanich, G.E. Holland, R. Korde, Optics Letters, Vol. 30 (2005), p.3120.

[10] J.R. Srour, IEEE Nuclear and Space Radiation Effects Conference, Short Course, Section IV (1988).

[11] J. Lefèvre, J. Costantini, S. Esnouf, and G. Petite, J. Appl. Phys., Vol. 105 (2009).

In order to see related information, you need to Login.