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Bistability of Thermal Donors in Germanium Investigated by Far-IR Spectroscopy
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Shallow Impurity Spectroscopy Using Cyclotron Resonance Lasers
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The Influence of Metallic Contamination on the Lattice Relaxation of Ge_xSi_1-x Epitaxial Alloys
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Impurity Photoconductivity in Ge_xSi_1-x Epitaxial Layers Doped with Phosphorus
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HomeMaterials Science ForumMaterials Science Forum Vols. 65-66Shallow Impurity Spectroscopy Using Cyclotron...

Shallow Impurity Spectroscopy Using Cyclotron Resonance Lasers

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Shallow Impurities in Semiconductors IV

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Periodical:

Materials Science Forum (Volumes 65-66)

Pages:

345-350

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.65-66.345

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Online since:

January 1991

Authors:

Yu.B. Vasilyev, Yu.L. Ivanov

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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