Application Software Development for the Engineering Materials Diffractometer, TAKUMI

Abstract:

Article Preview

The Engineering Materials Diffractometer Application Kit called EMAKi has been developed to control the Engineering Materials Diffractometer, TAKUMI, and treat data obtained by it. It is expected that TAKUMI will be widely used by not only academic users but also industrial users. We have designed EMAKi to be user-friendly interface for novice users by graphical user interface (GUI). In addition, adopting Python programming language for its development has enabled advanced users to control the diffractometer flexibly and treat the data easily. During instrumentation commissioning and running user programs, the software has demonstrated useful.

Info:

Periodical:

Edited by:

Y. Akiniwa, K. Akita and H. Suzuki

Pages:

238-242

DOI:

10.4028/www.scientific.net/MSF.652.238

Citation:

T. Ito et al., "Application Software Development for the Engineering Materials Diffractometer, TAKUMI", Materials Science Forum, Vol. 652, pp. 238-242, 2010

Online since:

May 2010

Export:

Price:

$35.00

[1] S. Harjo, A. Moriai, S. Torii, H. Suzuki, K. Suzuya, Y. Morii, M. Arai, Y. Tomota, K. Akita and Y. Akiniwa: Mater. Sci. Forum Vol. 524-525 (2006), p.199.

DOI: 10.4028/www.scientific.net/msf.524-525.199

[2] S. Harjo, K. Aizawa, T. Ito, H. Arima, J. Abe, A. Moriai, K. Sakasai, T. Nakamura, T. Nakatani, T. Iwahashi and T. Kamiyama: submitted to Mater. Sci. Forum.

DOI: 10.4028/www.scientific.net/msf.652.99

[3] K. Nakayoshi, Y. Yasu, E. Inoue, H. Sendai, M. Tanaka, S. Satoh, S. Muto, N. Kaneko, T. Otomo, T. Nakatani and T. Uchida : Nucl. Instrrum. Methods Phys. Res., Sect. A Vol. 600 (2009) p.173.

[4] J. Suzuki, T. Nakatani, T. Ohhara, Y. Inamura, M. Yonemura, T. Morishima, T. Aoyagi, A. Manabe and T. Otomo: Nucl. Instrrum. Methods Phys. Res., Sect. A Vol. 600 (2009) p.123.

[5] T. Nakatani, Y. Inamura, T. Ito, S. Harjo, R. Kajimoto, M. Arai, T. Ohhara, H. Nakagawa, T. Aoyagi, T. Otomo, J. Suzuki, T. Morishima, S. Muto, R. Kadono, S. Torii, Y. Yasu, T. Hosoya and M. Yonemura: submitted to Proceedings of ICALEPCS2009 JACoW.

[6] J. D. Jorgensen, J. Faber Jr., J. M. Carpenter, R. K. Crawford, J. R. Haumann, R. L. Hitterman, R. Kleb, G. E. Ostrowski, F. J. Rotella and T. G. Worlton: J. Appl. Crystallogr. Vol. 22 (1989) p.321.

DOI: 10.1107/s002188988900289x

[7] N. Watanabe, H. Asano, H. Iwasa, S. Satoh, H. Murata, K. Karahashi, S. Tomiyoshi, F. Izumi and K. Inoue: Jpn. J. Appl. Phys. Vol. 26 (1987) p.1164.

DOI: 10.1143/jjap.26.1164

In order to see related information, you need to Login.