3D Characterisation of Grain Deformation under Synchrotron Radiation


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Recently, three-dimensional (3D) observation and analysis have attracted considerable attention in materials science field. By using the synchrotron radiation, the tomography makes possible high-resolution 3D observation dynamically and the recent diffraction analysis is available for 3D orientation mapping. In this study, grain deformation behavior in polycrystalline aluminum alloy has been characterized by 3D observation method applying the synchrotron radiation. The method to measure inner strain distribution by means of microstructural features tracking provides strain distribution within the sample, which we could not access before. The effect of grain orientation and its interaction during tensile deformation was discussed with the obtained strain distribution.



Materials Science Forum (Volumes 654-656)

Main Theme:

Edited by:

Jian-Feng Nie and Allan Morton




M. Kobayashi et al., "3D Characterisation of Grain Deformation under Synchrotron Radiation", Materials Science Forum, Vols. 654-656, pp. 2303-2306, 2010

Online since:

June 2010




[1] X. Huang: Scripta Mater. 38 (1998) 1697-1703.

[2] N. Hansen: Metall. Mater. Trans. A 32A (2001) 2917.

[3] A. Tatschl, O. Kolednik: Mater. Sci. Eng. A364 (2004) 384-399.

[4] L. Delannay, O. V. Mishin, D. Juul Jensen and P. Van Houtte: Acta mater. 49 (2001) 2441-2451.

[5] J. Kang, M . Jain, D. S. Wilkinson, J. D. Embury, J. Strain. Anal. Eng. Des. 40 (2005) 559-70.

[6] H. Toda, T. Hidaka, M. Kobayashi, K. Uesugi, A. Takeuchi, K. Horikawa: Acta Mater. 57 (2009) 2277-2290.

[7] H. Toda, K. Minami, K. Koyama, K. Ichitani, M. Kobayashi, K. Uesugi, Y. Suzuki: Acta Mater. 57 (2009) 4391-4403.

DOI: https://doi.org/10.1016/j.actamat.2009.06.012

[8] M. Kobayashi, H. Toda, Y. Kawai, T. Ohgaki, K. Uesugi, D. S. Wilkinson, T. Kobayashi, Y. Aoki and M. Nakazawa: Acta Mater. 56 (2008) 2167-2181.

DOI: https://doi.org/10.1016/j.actamat.2007.12.058

[9] H. F. Poulsen, Three-dimensional X-ray Diffraction Microscopy, Springer, Berlin (2004).