Study on the Energy Structure of Amorphous Antireflection Er2O3 Films on Si(001) Substrates

Abstract:

Article Preview

Er2O3 films were deposited on Si(001) substrates by radio frequency magnetron technique. X-ray photoelectron spectroscopy, x-ray diffraction and atomic force microscopy show the Er2O3 films obtained are stoichiometric, amorphous, and uniform. The electronic structure is studied which shows a large energy gap value of the Er2O3 film, indicating Er2O3 film could be a promising antireflection coating for solar cells.

Info:

Periodical:

Materials Science Forum (Volumes 663-665)

Edited by:

Yuan Ming Huang

Pages:

612-615

DOI:

10.4028/www.scientific.net/MSF.663-665.612

Citation:

Y. Y. Zhu et al., "Study on the Energy Structure of Amorphous Antireflection Er2O3 Films on Si(001) Substrates", Materials Science Forum, Vols. 663-665, pp. 612-615, 2011

Online since:

November 2010

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.