Electron back scattered diffraction (EBSD) was used to document the microstructure and texture developed due to cross deformation of commercial purity 1050 aluminum alloy. The materials was first deformed in equal channel angular pressing die (ECAP) to one and two passes, via route BC and then deformed in plane strain compression (PSC) to two axial true plastic strain values of 0.5 and 1.0. The study provides a documentation of the evolution of microstructure parameters namely; cell size, misorientation angle, fraction of submicron grain size and fraction of high angle grain boundaries. These microstructure parameters were investigated on the plane normal to the loading direction in PSC (RD-TD). These microstructure parameters are compared to those achieved due to the ECAP process only. The ideal rolling texture orientations are depicted and crystal orientation maps were generated. The spatial distribution of grains having these orientations are revealed through these maps. The fraction of the main texture components for a 10o spread around the specified orientations is experimentally calculated and a quantitative idea on the evolution of microtexture is presented.