Effect of Laser Power on the Microstructure of Ni-P Layer Deposited on Aluminum Substrate


Article Preview

Laser processing of Ni-P layer electroless deposited on aluminum substrate was carried out by Nd-YAG pulsed laser. Different laser processing parameters were selected. When lower laser power density was employed, the modified Ni-P layer was obtained, however, when employed laser power density increased, laser alloying of Ni-P layer with aluminum substrate occurred. The characteristic dendritic or lamellar microstructures were observed in the alloyed layer. The phase constituents of the alloyed zones determined by X-ray diffraction are consisted of nickel-aluminum intermetallic compounds NiAl, Al3Ni and Al3Ni2, as well as some non-equilibrium phases, depending on the employed laser power density.



Edited by:

Yafang Han, Fusheng Pan, Jianmao Tang, Chungen Zhou




Y. Yang and J. D. Hu, "Effect of Laser Power on the Microstructure of Ni-P Layer Deposited on Aluminum Substrate", Materials Science Forum, Vol. 686, pp. 539-545, 2011

Online since:

June 2011




[1] W. J. Tomlinson, A. S. Bransden, Surf. Eng. 11 (4) (1990). 337.

[2] G. G. Gawrilov, Chemical (electroless) Nickel Plating, Portcullis Press, Surrey, (1979).

[3] A. Bremmer, G.E. Riddel, J. Res. Natl. Bur. Stand. 37 (1) (1946) 31.

[4] G.O. Mallory, J.B. Hajdu (Eds. ), Electroless Plating: Fundamentals and Applications, AESF, Orlando, (1991).

[5] W. Riedel, Electroless Plating, ASM International, Ohio, (1991).

[6] D.W. Baudrand, Electroless Nickel plating, surface engineering, ASM Hand Book, vol. 5, American Society for Materials, Material Park, Ohio, 1994, p.290.

[7] Y. Yang, J.D. Hu, H.Y. Wang, et. al.

[8] J. Singh, Laser: the leading for surface treatments, Proceedings International Conference on Beam Processing of Advance Materials, The Minerals, Metal & Materials, Society, (1993).

[9] J. Senthil Selvan Surface and Coatings Technology 124 (2000) 117-127.

[10] Colin J. Smithells, Metals Reference Book, Fifth Edition.

[11] Milton Ohring, The Materials Science of Thin Films Academic Press (2002) 595.

[12] L.E. Greenwald, E.M. Breinan and B.H. Kear, Am. Inst. of Phys., NY, (1978).