Local Strain Calculations Using Electron Backscattered Diffraction (EBSD) Measurements and Digital Image Processing


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Measurement of local strains in poly-crystalline materials, subjected to relatively large plastic deformation, is a challenging problem. In this paper we report a novel approach for the calculation of local strains at microscopic levels using Electron Backscattered Diffraction measurements, and subsequent use of digital image processing and a simple algorithm. Identical grains, of a fully recrystallized commercial AA1050 sheet, were indexed before and after a tensile strain of 0.262. Normal and shear strains were calculated by estimating the changes in grain shape and in plane rotation. An excellent correlation was obtained between measured in-grain misorientation developments and the estimated in-grain von-Mises equivalent strains.



Materials Science Forum (Volumes 702-703)

Edited by:

Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar




S. Mukherjee et al., "Local Strain Calculations Using Electron Backscattered Diffraction (EBSD) Measurements and Digital Image Processing", Materials Science Forum, Vols. 702-703, pp. 562-565, 2012

Online since:

December 2011




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