Local Strain Calculations Using Electron Backscattered Diffraction (EBSD) Measurements and Digital Image Processing

Abstract:

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Measurement of local strains in poly-crystalline materials, subjected to relatively large plastic deformation, is a challenging problem. In this paper we report a novel approach for the calculation of local strains at microscopic levels using Electron Backscattered Diffraction measurements, and subsequent use of digital image processing and a simple algorithm. Identical grains, of a fully recrystallized commercial AA1050 sheet, were indexed before and after a tensile strain of 0.262. Normal and shear strains were calculated by estimating the changes in grain shape and in plane rotation. An excellent correlation was obtained between measured in-grain misorientation developments and the estimated in-grain von-Mises equivalent strains.

Info:

Periodical:

Materials Science Forum (Volumes 702-703)

Edited by:

Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar

Pages:

562-565

DOI:

10.4028/www.scientific.net/MSF.702-703.562

Citation:

S. Mukherjee et al., "Local Strain Calculations Using Electron Backscattered Diffraction (EBSD) Measurements and Digital Image Processing", Materials Science Forum, Vols. 702-703, pp. 562-565, 2012

Online since:

December 2011

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$35.00

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