Plastic Domain Microstructure and Hardness Analysis of Indented Layered Composite
The size dependent hardening in Al-4wt%Cu thin film on Si substrate has been investigated by the numerical calculation of indentation stress field and the observation of plastic zone microstructure of indented film. Distribution of internal stress predicted by triangular dislocation loop (TDL) model shows no size dependency with the different number of dislocations when the constant line density is assumed at the contact surface. TEM cross-sectional observation reveals that the plastic deformation is dominantly induced inside the film, and the growth of plastic zone is restricted at the interface of hard Si substrate. The size dependent hardening in soft film and hard substrate system is discussed from the change in dislocation density with respect to the plastic zone microstructure.
T. Chandra, M. Ionescu and D. Mantovani
S. Muraishi and M. Takaya, "Plastic Domain Microstructure and Hardness Analysis of Indented Layered Composite", Materials Science Forum, Vols. 706-709, pp. 2892-2897, 2012