Positron Annihilation Parameters in Connection to Surface Phenomenon of Liquids


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Surface tension is an important property of liquid, the bulk surface tension concept changes considerably when minute volume of a given liquid (drop let radius<10nm) is considered. Although an extensive thermodynamical treatment and theoretical basis have been considered in the past on the curvature dependence of surface tension, yet its experimental evaluation is deemed necessary and it has been shown hither to that positronium annihilation parameters serve faithfully to this purpose. However, the drastic lowering of surface tension with the dispersion of surfactant in the liquid phase display a different phenomenon altogether and has been dealt separately by positron annihilation results.



Edited by:

Jozef Krištiak, Jan Kuriplach and Pradeep K. Pujari




B. N. Ganguly, "Positron Annihilation Parameters in Connection to Surface Phenomenon of Liquids", Materials Science Forum, Vol. 733, pp. 121-126, 2013

Online since:

November 2012




[1] Samuel Glasstone: Text book of Physical Chemistry (Macmillan India Ltd. vide special agreement D. Van Nostrand Co. Inc, U.S.A., 1997).

[2] Gilbert W. Castellan : Physical Chemistry ( Narosa Publishing House, 2002).

[3] R.C. Tolman: J. Chem. Phys. vol. 17 (1949), p.333.

[4] R.A. Ferrell, Phys. Rev. vol. 108 (1957), p.167.

[5] Dhanadeep Dutta, Bichitra Nandi Ganguly, Debarshi Gangopadhyay Tapas Mukherjee and Binayak Dutta-Roy, J. Phys.: Cond. Matter vol. 14 (2002), pp.7539-7549.

DOI: https://doi.org/10.1088/0953-8984/14/32/313

[6] The experimental data included are partly from our laboratory at SINP vide thesis : Debarshi Gangopadhyay (2002).

[7] Milton J. Rosen: Surfactants and Interfacial Phenomena (John Wiley and Sons 1978).

[8] V. M. Byakov and S.V. Stepanov, Rad. Phys. Chem. Vol. 41 (1993), p.559.

[9] Subir K. Das , Thesis : A study on Triton X-100 Surfactant System using Positron Annihilation Spectroscopy and Photo Chemical Reactions. (1997).

[10] Jean Y.C., Ache H.J., J Am. Chem. Soc. Vol. 100 (1978), p.984.