ECL-Based SiC Logic Circuits for Extreme Temperatures

Abstract:

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Integrated digital circuits, fabricated in a bipolar SiC technology, have been successfully tested up to 600 °C. Operated with-15 V supply voltage from 27 up to 600 °C OR-NOR gates exhibit stable noise margins of about 1 or 1.5 V depending on the gate design, and increasing delay-power consumption product in the range 100 - 200 nJ. In the same temperature range an oscillation frequency of about 1 MHz is also reported for an 11-stage ring oscillator.

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Periodical:

Materials Science Forum (Volumes 821-823)

Edited by:

Didier Chaussende and Gabriel Ferro

Pages:

910-913

Citation:

L. Lanni et al., "ECL-Based SiC Logic Circuits for Extreme Temperatures", Materials Science Forum, Vols. 821-823, pp. 910-913, 2015

Online since:

June 2015

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$38.00

* - Corresponding Author

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