Infrared Reflectance Study of the Graphene/Semi-Insulating 6H-SiC(0001) Heterostructure

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The optical response of graphene on 6H-SiC was investigated by means of IR-reflectance measurements. Thereby, the anisotropy of the substrate is considered and its influence was studied by performing measurements with s- and p-polarized light. The anisotropy causes a splitting of the reststrahlen band in p-polarization, but does not affect spectra recorded with s-polarization. In both cases a thin film approximation was used to simulate the reflectance spectra. A model consisting of SiC, graphene and air enables the extraction of the graphene layer count.

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Edited by:

Robert Stahlbush, Philip Neudeck, Anup Bhalla, Robert P. Devaty, Michael Dudley and Aivars Lelis

Pages:

314-317

Citation:

M. Auge et al., "Infrared Reflectance Study of the Graphene/Semi-Insulating 6H-SiC(0001) Heterostructure", Materials Science Forum, Vol. 924, pp. 314-317, 2018

Online since:

June 2018

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