Infrared Reflectance Study of the Graphene/Semi-Insulating 6H-SiC(0001) Heterostructure
The optical response of graphene on 6H-SiC was investigated by means of IR-reflectance measurements. Thereby, the anisotropy of the substrate is considered and its influence was studied by performing measurements with s- and p-polarized light. The anisotropy causes a splitting of the reststrahlen band in p-polarization, but does not affect spectra recorded with s-polarization. In both cases a thin film approximation was used to simulate the reflectance spectra. A model consisting of SiC, graphene and air enables the extraction of the graphene layer count.
Robert Stahlbush, Philip Neudeck, Anup Bhalla, Robert P. Devaty, Michael Dudley and Aivars Lelis
M. Auge et al., "Infrared Reflectance Study of the Graphene/Semi-Insulating 6H-SiC(0001) Heterostructure", Materials Science Forum, Vol. 924, pp. 314-317, 2018