Texture and Microstructure Imaging by the Moving Area Detector Method
Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components.
C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner
A. Preusser et al., "Texture and Microstructure Imaging by the Moving Area Detector Method", Solid State Phenomena, Vol. 105, pp. 3-14, 2005