Texture and Microstructure Imaging by the Moving Area Detector Method

Abstract:

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Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components.

Info:

Periodical:

Solid State Phenomena (Volume 105)

Edited by:

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner

Pages:

3-14

DOI:

10.4028/www.scientific.net/SSP.105.3

Citation:

A. Preusser et al., "Texture and Microstructure Imaging by the Moving Area Detector Method", Solid State Phenomena, Vol. 105, pp. 3-14, 2005

Online since:

July 2005

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Price:

$35.00

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