Local Orientation Measurements in 3D


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The 3 Dimensional X-Ray Diffraction (3DXRD) method is presented and its potentials illustrated by examples. The 3DXRD method is based on diffraction of high energy X-rays and allows fast and nondestructive 3D characterization of the local distribution of crystallographic orientations in the bulk. The spatial resolution is about 1x5x5 µm but diffraction from microstructural elements as small as 100 nm may be monitored within suitable samples. As examples of the use of the 3DXRD method, it is chosen to present results for complete 3D characterization of grain structures, in-situ “filming” of the growth of one interior grain during recrystallization, recrystallization kinetics of individual grains and crystallographic rotations of individual grains during tensile deformation.



Solid State Phenomena (Volume 105)

Edited by:

C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner




D. Juul Jensen, "Local Orientation Measurements in 3D", Solid State Phenomena, Vol. 105, pp. 49-54, 2005

Online since:

July 2005




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