Lattice and Peak Profile Parameters in GIXD Technique
Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line.
Danuta Stróż & Małgorzata Karolus
T. Goryczka et al., "Lattice and Peak Profile Parameters in GIXD Technique", Solid State Phenomena, Vol. 130, pp. 281-286, 2007