Lattice and Peak Profile Parameters in GIXD Technique

Abstract:

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Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line.

Info:

Periodical:

Solid State Phenomena (Volume 130)

Edited by:

Danuta Stróż & Małgorzata Karolus

Pages:

281-286

DOI:

10.4028/www.scientific.net/SSP.130.281

Citation:

T. Goryczka et al., "Lattice and Peak Profile Parameters in GIXD Technique", Solid State Phenomena, Vol. 130, pp. 281-286, 2007

Online since:

December 2007

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Price:

$35.00

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