Terahertz Emission from Phosphor Centers in SiGe and SiGe/Si Semiconductors

Abstract:

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Terahertz-range photoluminescence from silicon-germanium crystals and superlattices doped by phosphor has been studied under optical excitation by radiation from a mid-infrared CO2 laser at low temperature. SiGe crystals with a Ge content between 0.9 and 6.5 %, doped by phosphor with a concentration optimal for silicon laser operation, do not exhibit terahertz gain. On the contrary, terahertz-range gain of ~ 2.3 - 3.2 cm-1 has been observed for donor-related optical transitions in Si/SiGe strained superlattices at pump intensities above 100 kW/cm2.

Info:

Periodical:

Solid State Phenomena (Volumes 131-133)

Edited by:

A. Cavallini, H. Richter, M. Kittler and S. Pizzini

Pages:

613-618

DOI:

10.4028/www.scientific.net/SSP.131-133.613

Citation:

S. G. Pavlov et al., "Terahertz Emission from Phosphor Centers in SiGe and SiGe/Si Semiconductors", Solid State Phenomena, Vols. 131-133, pp. 613-618, 2008

Online since:

October 2007

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$35.00

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