Advanced Metrologies for Cleans Characterization: ARXPS, GIXF and NEXAFS

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Periodical:

Solid State Phenomena (Volume 134)

Edited by:

Paul Mertens, Marc Meuris and Marc Heyns

Pages:

281-284

DOI:

10.4028/www.scientific.net/SSP.134.281

Citation:

T. Conard et al., "Advanced Metrologies for Cleans Characterization: ARXPS, GIXF and NEXAFS ", Solid State Phenomena, Vol. 134, pp. 281-284, 2008

Online since:

November 2007

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$35.00

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