Advanced TXRF Analysis: Background Reduction when Measuring High-k Materials and Mapping Metallic Contamination

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Periodical:

Solid State Phenomena (Volume 134)

Edited by:

Paul Mertens, Marc Meuris and Marc Heyns

Pages:

285-288

DOI:

10.4028/www.scientific.net/SSP.134.285

Citation:

C. Sparks et al., "Advanced TXRF Analysis: Background Reduction when Measuring High-k Materials and Mapping Metallic Contamination", Solid State Phenomena, Vol. 134, pp. 285-288, 2008

Online since:

November 2007

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$35.00

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