Wavelet Analysis of Barkhausen Noise in Reconstructing Distributions of Residual Stress

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The paper presents an application of non-destructive estimate of approximate distributions of residual stresses as the function of surface layer depth. The application uses an innovative technique of wavelet analysis of Barkhausen noise, which is able to estimate layout of surface layer properties as the function of measurement depth in the range greater than that offered by other methods of non-destructive testing. The estimate of stress distribution as the function of depth is compared with the result obtained from X-ray stress test using electrolytic etching. The comparison presents very similar curves of stress distribution, so the wavelet analysis of Barkhausen noise can be considered as a reliable method of non-destructive testing of an engineering object.

Info:

Periodical:

Solid State Phenomena (Volume 144)

Edited by:

Inga Skiedraite and Jolanta Baskutiene

Pages:

112-117

DOI:

10.4028/www.scientific.net/SSP.144.112

Citation:

C. Kownacki "Wavelet Analysis of Barkhausen Noise in Reconstructing Distributions of Residual Stress", Solid State Phenomena, Vol. 144, pp. 112-117, 2009

Online since:

September 2008

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$35.00

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