X-Ray Diagnostics of Magnetic Semiconductor Quantum Well Structures

Abstract:

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In the present contribution the results of the high-resolution X-ray diffraction and X-ray glancing-incidence mirror reflection studies of structural characteristics of the quantum-well GaAs/Ga1-xInxAs/GaAs diluted magnetic semiconductors (DMSC) are presented. The influence of the real structure of the samples on their electro-physical properties is discussed.

Info:

Periodical:

Solid State Phenomena (Volumes 152-153)

Edited by:

N. Perov

Pages:

537-540

DOI:

10.4028/www.scientific.net/SSP.152-153.537

Citation:

I.A. Likhachev et al., "X-Ray Diagnostics of Magnetic Semiconductor Quantum Well Structures", Solid State Phenomena, Vols. 152-153, pp. 537-540, 2009

Online since:

April 2009

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Price:

$35.00

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