X-Ray Diagnostics of Magnetic Semiconductor Quantum Well Structures
In the present contribution the results of the high-resolution X-ray diffraction and X-ray glancing-incidence mirror reflection studies of structural characteristics of the quantum-well GaAs/Ga1-xInxAs/GaAs diluted magnetic semiconductors (DMSC) are presented. The influence of the real structure of the samples on their electro-physical properties is discussed.
I.A. Likhachev et al., "X-Ray Diagnostics of Magnetic Semiconductor Quantum Well Structures", Solid State Phenomena, Vols. 152-153, pp. 537-540, 2009