Thickness Dependence of Surface and Interface Phonon-Polariton Modes in InN/AlN Nanolayers

Abstract:

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We study the conditions for appearance and observation of surface and interface phonon-polariton (SPP and IPP) modes in thin InN layers grown on sapphire using AlN buffer. Theoretical dispersion relations of the IPP modes in the system air/InN/AlN/sapphire for different thickness of the InN layer are obtained. Features in the experimentally measured infrared reflectance were associated with the appearance of interface phonon-polariton excitations at wave-numbers between the TO and LO modes.

Info:

Periodical:

Solid State Phenomena (Volume 159)

Edited by:

Lilyana Kolakieva and Roumen Kakanakov

Pages:

77-80

DOI:

10.4028/www.scientific.net/SSP.159.77

Citation:

E. Valcheva et al., "Thickness Dependence of Surface and Interface Phonon-Polariton Modes in InN/AlN Nanolayers", Solid State Phenomena, Vol. 159, pp. 77-80, 2010

Online since:

January 2010

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$35.00

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