CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3

Abstract:

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Determination of stable phases formed at the Fe/Si interface in (Fe/Si)n structure, grown by thermal evaporation in an ultrahigh vacuum system was performed using conversion electron Mössbauer spectroscopy (CEMS).

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Periodical:

Solid State Phenomena (Volumes 168-169)

Main Theme:

Edited by:

V. Ustinov

Pages:

277-280

DOI:

10.4028/www.scientific.net/SSP.168-169.277

Citation:

S.N. Varnakov et al., "CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3", Solid State Phenomena, Vols. 168-169, pp. 277-280, 2011

Online since:

December 2010

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$35.00

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