CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3
Determination of stable phases formed at the Fe/Si interface in (Fe/Si)n structure, grown by thermal evaporation in an ultrahigh vacuum system was performed using conversion electron Mössbauer spectroscopy (CEMS).
S.N. Varnakov et al., "CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)3", Solid State Phenomena, Vols. 168-169, pp. 277-280, 2011