Exchange Bias Induced in Polycrystalline Co/FeMn-Structures by Magnetic Field Cooling
Using the method of angular dependence of ferromagnetic resonance field the magnetic properties of Si/SiO2/Cu/Co/FeMn/Cu and Si/SiO2/Cu/Co/Cu/FeMn/Cu structures were investigated. The layer deposition was carried out by magnetron sputtering in absence of an external magnetic field. It was established that thermal annealing with further cooling down in presence of a magnetic field can generate an exchange bias at anneal temperature significantly below the bulk antiferromagnetic Néel temperature. It was also shown that a thin interlayer between ferromagnetic and antiferromagnetic layers reduces the exchange bias effect at low anneal temperatures, however, makes this effect more stable at high annealing temperatures.
N. Perov and V. Rodionova
N.G. Chechenin et al., "Exchange Bias Induced in Polycrystalline Co/FeMn-Structures by Magnetic Field Cooling", Solid State Phenomena, Vol. 190, pp. 81-84, 2012