Structure and Magnetic Properties of FeNi/Ti Multilayered Films Grown by Magnetron Sputtering

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Structure and magnetic properties of FeNi/Ti multilayers prepared by magnetron sputtering were studied. The dependences of the spontaneous magnetization and hysteresis features of the films on the thickness of the magnetic layers were established. It was shown that these properties were to a large extent determined by interlayer interfaces, in which the effective magnetization decreases. The possible reason for the interface peculiarities was the interlayer mixing. The presence of (FeNi)Ti phase which was formed by the interdiffusion of FeNi and Ti layers was confirmed by X-ray diffraction measurements.

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Periodical:

Solid State Phenomena (Volumes 233-234)

Edited by:

Nikolai Perov and Anna Semisalova

Pages:

591-594

Citation:

A. V. Svalov et al., "Structure and Magnetic Properties of FeNi/Ti Multilayered Films Grown by Magnetron Sputtering", Solid State Phenomena, Vols. 233-234, pp. 591-594, 2015

Online since:

July 2015

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$38.00

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[1] M. Johnson (Ed. ), Magnetoelectronics, Elsevier Inc., Amsterdam, (2004).

[2] G.V. Kurlyandskaya, S.M. Bhagat, A.V. Svalov, E. Fernandez, A. Garcia-Arribas, J.M. Barandiaran. FeNi-based film nanostructures for high frequency applications: design and characterization, Solid State Phenom. 168-169 (2011) 257-260.

DOI: https://doi.org/10.4028/www.scientific.net/ssp.168-169.257

[3] Y. Li, Y. Lu, W.E. Bailey, Single-domain shape anisotropy in near-macroscopic Ni80Fe20 thin-film rectangles, J. Appl. Phys. 113 (2013) 17B506-3.

DOI: https://doi.org/10.1063/1.4794876

[4] M. Kowalewski, W.H. Butler, N. Moghadam, et al., The effect of Ta on the magnetic thickness of permalloy (Ni81Fe19) films, J. Appl. Phys. 87 (2000) 5732- 5734.

[5] G.V. Kurlyandskaya, A. García-Arribas, E. Fernández, A.V. Svalov, Nanostructured magnetoimpedance multilayers, IEEE Trans. Magn. 48 (2012) 1375-1380.

DOI: https://doi.org/10.1109/tmag.2011.2171330

[6] L.P. Yue, W.G. Yao, Z.Z. Qi, Y.Z. He, Structure of nanometer-size crystalline Ti film, Solid Nanostruct. Mater. 4 (1994) 451–456.

DOI: https://doi.org/10.1016/0965-9773(94)90116-3

[7] V.O. Vas'kovskiy, G.S. Patrin, D.A. Velikanov, A.V. Svalov, N.N. Shchegoleva, Spontaneous magnetization and features of temperature-induced magnetization process in planar Co/Si nanostructures. Low Temp. Phys. 33 (2007) 324-328.

DOI: https://doi.org/10.1063/1.2720079

[8] Low moment material for magnetic recording head write pole. U.S. Patent, Patent Nо.: US 6809901 B2. Int. Cl. G11B5/31. Date of Patent: Oct. 26, (2004).

[9] V.O. Vas'kovskij, P.A. Savin, V.N. Lepalovskij, G.S. Kandaurova, Yu. M. Yarmoshenko, Specific features of hysteresis properties and domain structure of layered magnetic films. Fizika Metal. Metall. 79 (1995) 70-77.