Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 63-64)

Edited by:

M. Kittler, O. Breitenstein, A. Endrös, W. Schröter

Pages:

261-272

DOI:

10.4028/www.scientific.net/SSP.63-64.261

Citation:

H. J. Müssig and J. Dąbrowski, "Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon", Solid State Phenomena, Vols. 63-64, pp. 261-272, 1998

Online since:

December 1998

Export:

Price:

$35.00

In order to see related information, you need to Login.