Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

447-452

DOI:

10.4028/www.scientific.net/SSP.95-96.447

Citation:

M. Seibt and V. V. Kveder, " Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon", Solid State Phenomena, Vols. 95-96, pp. 447-452, 2004

Online since:

September 2003

Export:

Price:

$35.00

In order to see related information, you need to Login.