Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon

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Periodical:

Solid State Phenomena (Volumes 95-96)

Edited by:

H. Richter and M. Kittler

Pages:

447-452

Citation:

M. Seibt and V. V. Kveder, " Microstructural and Electrical Properties of NiSi2 Precipitates at Dislocations in Silicon", Solid State Phenomena, Vols. 95-96, pp. 447-452, 2004

Online since:

September 2003

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$38.00

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