Formation and Characteristics of Thin Films of ZrO2-8 mol % Y2O3 Solid Electrolytes

Abstract:

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Thin films of ZrO2-8mol%Y2O3 have been deposed by pulsed DC magnetron sputtering method. The substrates of Ni-cermet and alloy-600 for the films were used. The results of the investigation of the X-ray diffraction patterns and SEM showed that the films are nanocrystalline and belong to cubic symmetry. The relaxation process is related to the ion transport in thin films. The results of the investigation of the temperature dependencies of thin films ionic conductivity (σ) showed that the dependence σ(T) is caused by the temperature dependence of oxygen vacancy mobility, while the number of charge carriers remains constant with temperature.

Info:

Periodical:

Solid State Phenomena (Volumes 97-98)

Edited by:

Stepas Janušonis

Pages:

153-158

DOI:

10.4028/www.scientific.net/SSP.97-98.153

Citation:

D. Milčius et al., "Formation and Characteristics of Thin Films of ZrO2-8 mol % Y2O3 Solid Electrolytes", Solid State Phenomena, Vols. 97-98, pp. 153-158, 2004

Online since:

April 2004

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$35.00

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