Papers by Author: In Seok Lee

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Authors: Ji Eon Yoon, Won Hyo Cha, Dong Hyun Hwang, Chul Su Lee, In Seok Lee, Young Gook Son
Abstract: The SBT(SrBi2Ta2O9) thin films with Bi2O3 buffer layer were deposited on Pt/Ti/SiO2/Si substrate by R.F. magnetron sputtering method in order to improve the ferroelectric characteristics. In SBT thin films, the deficiency of bismuth due to its volatility during the process results in an obvious non stoichiometry of the films and the presence of secondary phases. Bi2O3 buffer layer was found to be effective to achieve lower temperature crystallization and improve ferroelectric properties of SBT thin films. Ferroelectric properties and crystallinities of SBT thin films with various substrate temperature of Bi2O3 buffer layer were observed, using X-Ray Diffraction (XRD), Precision LC (Radient Technologies. Inc.) and GDS (glow discharge spectrometer).
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Authors: Won Hyo Cha, Ji Eon Yoon, Dong Hyun Hwang, Chul Su Lee, In Seok Lee, Young Gook Son
Abstract: Lanthanum modified lead zirconate titanate (Pb1.1La0.08Zr0.65Ti0.35O3) thin films were fabricated on indium-doped tin oxide (ITO)-coated glass substrate by r.f magnetron sputtering method. The thin films were deposited at 500°C and annealed at various temperature (550~600°C) by rapid thermal processing. The structure and morphology of the films were characterized with X-ray diffraction and atomic force microscopy. The hysteresis loops and fatigue properties of thin films were measured by precision material analyzer. As the annealing temperature increased, the remnant polarization value increased from 10.58 DC/cm2 to 31.35 DC/cm2, coercive field was reduced from 79.906 kV/cm to 60.937 kV/cm. For the switching polarization endurance analysis, the remnant polarization of PLZT thin films annealed at 700°C was decreased 15% after 109 switching cycles using 1MHz square wave form at 5V.
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