Papers by Author: Kimmo Saarinen

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Authors: Reino Aavikko, Kimmo Saarinen, Björn Magnusson, Erik Janzén
Abstract: Positron annihilation radiation Doppler broadening spectroscopy was used to study defects in semi-insulating (SI) silicon carbide (SiC) substrates grown by high-temperature chemical vapour deposition (HTCVD). The Doppler broadening measurements show (i) that the measured samples contain vacancy clusters (ii) that the positron trapping to the clusters is increased in annealing (iii) that the chemical environment of the defects in the un-annealed samples is different from those of the annealed samples.
575
Authors: M. Bojinov, G. Fabricius, J. Ihonen, T. Laitinen, J. Piippo, Kimmo Saarinen, G. Sundholm
117
Authors: B. Geffroy, C. Corbel, M. Stucky, R. Triboulet, Pekka J. Hautojärvi, F. Plazaola, Kimmo Saarinen, H. Rajainmäki, J. Aaltonen, P. Moser, A Sengupta, J.L. Pautrat
1241
Authors: T. Laine, Kimmo Saarinen, Pekka J. Hautojärvi, C. Corbel
879
Authors: Antti Pelli, Antti Laakso, Klaus Rytsölä, Reino Aavikko, Mikko Rummukainen, Kimmo Saarinen
504
Authors: K. Krambrock, C. Le Berre, C. Corbel, Kimmo Saarinen, Pekka J. Hautojärvi
195
Authors: Kimmo Saarinen, S. Kuisma, J. Mäkinen, Pekka J. Hautojärvi, M. Törnqvist, C. Corbel
1055
Authors: H.P. Gislason, K. Leosson, H. Svavarsson, Kimmo Saarinen, A. Mari
1813
Authors: T. Laine, J. Mäkinen, Kimmo Saarinen, Pekka J. Hautojärvi, C. Corbel, Pierre Gibart
1073
Authors: Kimmo Saarinen, S. Kuisma, Pekka J. Hautojärvi, C. Corbel, C. LeBerre
341
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