Papers by Author: Min Chen

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Authors: X.A. Mei, Min Chen, W.K. An, Chong Qing Huang, J. Liu, A.H. Cai
Abstract: Pr-doped bismuth titanate (BixPryTi3O12: BPT) thin films with random orientation were fabricated on Pt/Ti/SiO2/Si substrates by rf magnetron sputtering technique, and the structures and Raman spectra of the films were investigated. XRD studies indicated that all of the BPT films consist of single phase of a bismuth-layered structure, showing a highly (117) oriented preferential growth with a minor fraction of (00l) orientation. For an increasing degree of Pr doping, Raman spectra studies revealed a substantial hardening of the vibration involving Bi atoms at the perovskite A site, whereas the Bi mode at the Bi2O2 layer is negligibly changed. From a comparison with a simple mass consideration, we identify a precise cation distribution, indicating a pronounced site selectivity of Pr ions for the A site for y ~ 1.2.
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Authors: Xin Jiang Lu, Ming Hui Huang, Min Chen, Yi Bo Li
Abstract: In practical application, a nominal model is often used to approximate the design of industrial system. This approximation could make the traditional design method less effective due to the existence of model uncertainty. In this paper, a novel robust design approach is proposed to design the robustness of the dynamic system under model uncertainty. The key idea of this proposed method is that it integrates the advantages of both the model-based dynamic robust design and the data-based uncertainty compensation. A simulation example is conducted to demonstrate the effectiveness of the proposed robust design method.
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Authors: Min Chen, Y.H. Sun, K.L. Su, J. Liu, S. Chen, Z.M. Wan
Abstract: Pr6O11-doped bismuth titanate and random oriented BixPryTi3O12 ( y = 0.3, 0.6, 0.9, 1.2) thin films were fabricated on Pt/Ti/SiO2/Si substrates by rf magnetron sputtering technique. These samples had polycrystalline Bi-layered perovskite structure without preferred orientation, and consisted of well developed rod-like grains with random orientation. Pr doping into BIT caused a shift of the Curie temperature (TC) of the BIT from 675°C to 578 , 517, 398 , and 315oC for the films with y = 0.3, 0.6, 0.9, and 1.2, respectively. The experimental results indicated that Pr doping into BIT result in a remarkable improvement in dielectric properties. Raman analysis shows that Pr3+ and Pr4+ ions substitution only appears in A-sit.
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Authors: Min Chen, W.K. An, A.H. Cai, Chong Qing Huang, K.L. Su, J. Liu
Abstract: The electrical properties and Microstructures of Tb-doped bismuth titanate (Bi3.3Tb0.6Ti3O12) ceramic were investigated. XRD analyses revealed that the sample had Bi-layered perovskite structure. SEM micrographs showed randomly oriented and plate-like morphology. The remanent polarization (Pr) and coercive field (Ec) of Bi3.3Tb0.6Ti3O12 ceramic are above 25 μC/cm2 and 80 KV/cm, respectively.
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Authors: Y.H. Cai, X.A. Mei, Min Chen, K.L. Su, W.K. An, J. Liu
Abstract: The electrical properties of Bi3.25Dy0.75Ti3O12 (BDT) and Bi3.25Gd0.75Ti3O12 (BGT) ceramics were investigated. The current-voltage curve of the BGT sample exhibits a negative differential resistance behavior, whereas that of the BDT sample exhibits a simple ohmic behavior. The impedance spectrum of the BDT and BGT samples indicate that both consist of semiconducting grain and moderately insulating grain boundary regions. XRD, SEM and EPMA analyses reveal crystalline phase characterized by a Bi-layered perovskite structure of Bi4Ti3O12 and the distribution of every element is uniform. Both BDT and BGT samples exhibit randomly oriented and plate-like morphology.
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Authors: Min Chen, X.A. Mei, Rui Fang Liu, C.Q. Huang, J. Liu
Abstract: The electrical properties of Sm-doped bismuth titanate,Bi4-xSmxTi3O12 (BST) ceramics prepared by a conventional electroceramic technique were investigated. XRD analyses revealed Bi-layered perovskite structure in all samples. The P-V hysteresis loops of samples with x=0.4 and 1.2 were characterized by large leakage current, whereas for samples with x=0.6 and 0.8 the P-E hysteresis loops were the saturated and undistorted hysteresis loops. The remanent polarization ( Pr ) and coercive field (Ec) of the BST ceramic with x=0.8 were above 20μC/cm2 and 60KV/cm , respectively.
154
Authors: Min Chen, X.A. Mei, A.H. Cai, J. Liu, Chong Qing Huang
Abstract: The electrical properties of Ce-doped bismuth titanate, Bi4-xCexTi3O12 (BCT) ceramics prepared by a conventional electroceramic technique were investigated. XRD analyses revealed Bi-layered perovskite structure in all samples. SEM micrographs showed randomly oriented and plate-like morphology. For the samples with x=0.4 and 1.0 the current-voltage characteristics exhibited negative differential resistance behaviors and their P-E hysteresis loops were characterized by large leakage current, whereas for the samples with x=0.6 and 0.8 the current-voltage characteristics showed simple ohmic behaviors and their P-E hysteresis loops were the saturated and undistorted hysteresis loops. The remanent polarization ( Pr ) and coercive field (Ec) of the BCT ceramic with x=0.8 were above 20μC/cm2 and 60KV/cm , respectively.
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Authors: S. Chen, A.H. Cai, X.A. Mei, Chong Qing Huang, W.K. An, Min Chen
Abstract: Sm-doped bismuth titanate and random oriented Bi4-xCexTi3O12 (BCT) thin films were fabricated on Pt/Ti/SiO2/Si substrates rf magnetron sputtering technique. The structures and the ferroelectric properties of the films were investigated. Ce doping leads to a marked improvement in the remanent polarization (Pr) and the coercive field (Ec). At the applied electric field of 100 kV/cm, Pr and Ec of the BCT (x = 0.8) film annealed at 650 oC are 20.5 μC/cm2 and 60 KV/cm, respectively. However, after 3 × 1010 switching cycles, 20% degradation of 2Pr is observed in the film.
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Authors: Min Chen, X.A. Mei, A.H. Cai, J. Liu, Chong Qing Huang
Abstract: Dy2O3-doped bismuth titanate (Bi4-xDyxTi3O12: BDT) thin films with random orientation were fabricated on Pt/Ti/SiO2/Si substrates by rf magnetron sputtering technique, and the structures and ferroelectric properties of the films were investigated. XRD studies indicated that all of BDT films consisted of single phase of a bismuth-layered structure with well-developed rod-like grains. The remanent polarization (Pr) and coercive field (Ec) of the BDT Film with x = 0.8 were 20 μC/cm2 and 60 KV/cm, respectively. After 3 × 1010 switching cycles, 20% degradation of Pr is observed in the film.
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Authors: X.A. Mei, Min Chen, R.F. Liu, Y.H. Sun, J. Liu
Abstract: The electrical properties of Dy-bismuth titanate (Bi4-xDyxTi3O12) prepared by a conventional ceramic technique have been investigated. At applied d.c. field below 200V/mm, the current-voltage curve of Dy-doped sample exhibits a simple ohmic behavior. The impedance spectrum of Dy-doped sample indicates that consist of semiconducting grain and moderately insulating grain boundary regions. XRD, SEM and EPMA analyses reveal crystalline phase characterized by a Bi-layered perovskite structure of Bi4Ti3O12 and the distribution of every element is uniform. Dy-doped sample exhibit randomly oriented and plate-like morphology.
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