Papers by Author: Y. Khang

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Authors: Jung Min Kim, Hyun Jung Her, Jeong Min Son, Y. Khang, Eun Hye Lee, Yong Sang Kim, Y.J. Choi, C.J. Kang
Abstract: Scanning probe microscope (SPM) with a conducting tip was used to electrically probe silicon nanocrystals (Si NCs) embedded in a SiO2 layer. The Si NCs were generated by the laser ablation method with compressed Si powder followed by a sharpening oxidation. The size of Si NCs is in the range of 10-50 nm, and the density is around 1011 /cm2. Using a conducting tip, the charge was injected directly into each Si NC, and the image contrast change and dC/dV curve shift caused by the trapped charges were monitored. The results were compared with those of the conventional MOS capacitor.
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