Papers by Author: A.E. Belyaev

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Authors: A.E. Belyaev, O. Polupan, W. Dallas, Sergei S. Ostapenko, D. Hess, John Wohlgemuth

Abstract: An experimental approach for fast crack detection and length determination in fullsize solar-grade crystalline silicon wafers using a...

Authors: Alexander A. Lebedev, A.E. Belyaev, N.S. Boltovets, V.N. Ivanov, Raisa V. Konakova, Ya.Ya. Kudryk, Victor V. Milenin, V.N. Sheremet

Abstract: We studied the heat resistance of AuTiBx (ZrBx) barrier contacts to n-SiC 6H and n-GaN. The Schottky barrier diode (SBD) parameters, the...

Authors: Mykola S. Boltovets, V.N. Ivanov, A.Yu. Avksentyev, A.E. Belyaev, A.G. Borisenko, O.A. Fedorovitsh, Raisa V. Konakova, Ya.Ya. Kudryk, Petr M. Lytvyn, Victor V. Milenin, A.V. Sachenko, Yu.N. Sveschnikov

Abstract: In this communication we present the results of study of new contact systems to GaN epitaxial layers grown on sapphire and n-type 6H-SiC...

Authors: S.M. Komirenko, Yu.G. Semenov, A.E. Belyaev, Yu.S. Ryabchenko
Authors: A.E. Belyaev, Hans Jürgen von Bardeleben, M.L. Fille, E. Oborina, Yu.S. Ryabchenko, A.U. Savchuk, Moissei K. Sheinkman
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